Order acceptance for jeita standards and publications are suspended due to the effects of coronavirus. Rea refrigerated display case led lighting performance 3. Zpower led x10490 technical data sheet sscqp70724 rev. Jeita eiaj ed 4701 300, environmental and endurance test methods for semiconductor devices stress test i.
Figure 1 unsaturated pressurized vapor test conditions frofile. Jeita ed4701002, procedure of the test time and the sample size determination for the life tests. The purpose of this test is to evaluate product durability under longterm. Then we check the product using the reliability test that is in compliance with jeita eiaj ed4701 or milstd883. Eiaj ed 4701 1 c111a datasheet, cross reference, circuit and application notes in pdf format. Jeita ed4704a wafer level reliability test methods for. Eiaj ed4701 b121 datasheet, cross reference, circuit and application notes in pdf format. Adding 3d models to pdfs acrobat pro adobe support. Purpose of establishment of these standards before the establishment of these standards, the standardization referring toeiaj ed 4701 environmental and endurance test methods for semiconductor devices established on feb. Eiaj ed 4701 high temperature storage 100 cycle 022 t a 40 oc30min 100 oc30min eiaj ed 4701 thermal shock number of damaged duration cycle item reference test conditions i lsl 2. Acrobat pro can create 3d pdfs but only from u3d ecma 1 files.
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